Basic principles, capabilities and applications of various microstructural methods not covered in MTS 581 and MTS 682. Scanning electron microscopy, electron probe microanalysis, X-ray fluorescence, field ion microscopy.
- Subject
- SST
- Credits (min)
- 3
- Credits (max)
- 3
- Credit unit
- Credits
- Type
- course
- Edition
- 2025-2026
- Catalog
- 2025-2026 SU Undergraduate Course Catalog
- Source
- coursecatalog.syracuse.edu